Overview of compositional measurement techniques for HgCdTe with emphasis on IR transmission, energy dispersive X-ray analysis and optical reflectance
- 1 June 1993
- journal article
- Published by IOP Publishing in Semiconductor Science and Technology
- Vol. 8 (6S) , 842-859
- https://doi.org/10.1088/0268-1242/8/6s/006
Abstract
Three techniques for determining the composition (x identical to mole fraction of CdTe) of Hg1-xCdxTe are reviewed. These three techniques are infrared transmission (often called FTIR, for Fourier transform infrared) spectroscopy, energy dispersive X-ray analysis (EDX) and optical reflectance (OR). A brief summary of several methods for determining composition in Hg1-xCdxTe is included.Keywords
This publication has 38 references indexed in Scilit:
- Temperature and composition dependence of the energy gap of Hg1−xCdxTe by two-photon magnetoabsorption techniquesJournal of Vacuum Science & Technology A, 1990
- The automatic determination of cadmium-mercury telluride compositionJournal of Applied Physics, 1988
- Photoluminescence of Cd-rich Hg1−xCdxTe alloys (0.7<x<1)Journal of Crystal Growth, 1985
- Energy gap versus alloy composition and temperature in Hg1−xCdxTeApplied Physics Letters, 1983
- Determination of band-gap parameters of Hg1−xCdxTe based on high-temperature carrier concentrationJournal of Applied Physics, 1983
- Energy gap versus alloy composition and temperature in Hg1−xCdxTeJournal of Applied Physics, 1982
- Intrinsic carrier concentration of Hg1−xCdxTeJournal of Applied Physics, 1979
- Temperature and Alloy Compositional Dependences of the Energy Gap of Hg1−xCdxTeJournal of Applied Physics, 1969
- Energy Gap in Hg1−xCdxTe by Optical AbsorptionJournal of Applied Physics, 1969
- Helicons and Nonresonant Cyclotron Absorption in Semiconductors. II.Physical Review B, 1969