A new approach to the determination of MS-barrier heights from photoelectric data and/or an alternative way to determine the value of the Richardson constant
- 31 October 1982
- journal article
- Published by Elsevier in Solid-State Electronics
- Vol. 25 (10) , 989-993
- https://doi.org/10.1016/0038-1101(82)90021-1
Abstract
No abstract availableKeywords
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