Simple and rapid determination of carrier concentration and mobility profiles in GaAs
- 30 August 1981
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 82 (3) , 287-292
- https://doi.org/10.1016/0040-6090(81)90196-6
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Automatic electrochemical profiling of Hall mobility in semiconductorsElectronics Letters, 1979
- Electrical and galvanomagnetic measurements on thin films and epilayersThin Solid Films, 1976
- Series resistance effects in semiconductor CV profilingIEEE Transactions on Electron Devices, 1975
- Resistivity, mobility and impurity levels in GaAs, Ge, and Si at 300°KSolid-State Electronics, 1968