Towards built-in-self-test for SNR testing of a mixed-signal IC
- 30 December 2002
- proceedings article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
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- A comprehensive approach for modeling and testing analog and mixed-signal devicesPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- A new procedure for weighted random built-in self-testPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- Full-speed testing of A/D convertersIEEE Journal of Solid-State Circuits, 1984