Identification of Chalcogen Point-Defect Sites in Silicon by Total-Energy Calculations
- 10 June 1985
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 54 (23) , 2525-2528
- https://doi.org/10.1103/physrevlett.54.2525
Abstract
We report parameter-free, self-consistent, electronic-structure and total-energy calculations for chalcogen point defects in crystalline silicon. Both possible defect sites of tetrahedral symmetry are investigated. The calculated total energies are discussed in terms of dissolution and reaction energies. From these, the stable defect position is identified as substitutional. The comparison of our theoretical results (spin and ground-state wave function) with experimental data such as infraredabsorption, EPR, and ENDOR spectra further supports this identification.Keywords
This publication has 22 references indexed in Scilit:
- Total-energy gradients and lattice distortions at point defects in semiconductorsPhysical Review B, 1985
- Migration of interstitials in siliconPhysical Review B, 1984
- Microscopic Theory of Atomic Diffusion Mechanisms in SiliconPhysical Review Letters, 1984
- Optical Properties of As-Antisite andDefects in GaAsPhysical Review Letters, 1984
- Tellurium-related trap levels in siliconApplied Physics A, 1984
- Electronic structure of substitutional chalcogen impurities in siliconPhysical Review B, 1983
- Electronic structure of deep-bonded substitutional impurities in siliconPhysical Review B, 1982
- Tellurium donors in siliconPhysical Review B, 1981
- The electrical properties of sulphur in siliconJournal of Applied Physics, 1981
- Paramagnetic Resonance Study of a Deep Donor in SiliconPhysical Review B, 1965