Ion-beam-induced effects in secondary ion mass spectrometry of inorganic salts
- 1 August 1982
- journal article
- Published by Elsevier in International Journal of Mass Spectrometry and Ion Physics
- Vol. 43 (4) , 233-247
- https://doi.org/10.1016/0020-7381(82)80011-9
Abstract
No abstract availableKeywords
This publication has 9 references indexed in Scilit:
- Secondary ion mass spectrometry of inorganic salts: Nitrites—nitratesInternational Journal of Mass Spectrometry and Ion Physics, 1981
- SIMS molecular cluster intensities of inorganic salts containing sulfur and nitrogen oxyanionsInternational Journal of Mass Spectrometry and Ion Physics, 1981
- ESCA investigations of ion beam effects on surfacesJournal of Electron Spectroscopy and Related Phenomena, 1979
- Secondary ion mass spectrometry as a means of surface analysisSurface Science, 1979
- Study of Inorganic Salts by Static and Dynamic Secondary Ion Mass SpectrometryBulletin des Sociétés Chimiques Belges, 1979
- Structure sensitive factors in molecular cluster formation by ion bombardment of single crystal surfacesSurface Science, 1978
- Effect of primary ion energy and surface chemistry on the secondary ion yields in low-energy SIMS experimentsJournal of Vacuum Science and Technology, 1978
- Criteria for bombardment-induced structural changes in non-metallic solidsRadiation Effects, 1975
- Surface investigation of solids by the statical method of secondary ion mass spectroscopy (SIMS)Surface Science, 1973