Changes in stress and coercivity after annealing of amorphous Co(Zr, Nb) thin films deposited by RF sputtering
- 1 March 1988
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Magnetics
- Vol. 24 (2) , 1752-1754
- https://doi.org/10.1109/20.11591
Abstract
No abstract availableThis publication has 10 references indexed in Scilit:
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