Introducing dependency into IC yield models

This publication has 8 references indexed in Scilit:

• A simple method for modeling VLSI yields
  Solid-State Electronics, 1982
• Comments on “some considerations in the formulation of IC yield statistics”
  Solid-State Electronics, 1981
• Some considerations in the formulation of IC yield statistics
  Solid-State Electronics, 1979
• Modification of Poisson statistics: modeling defects induced by diffusion
  IEEE Journal of Solid-State Circuits, 1977
• On a composite model to the IC yield problem
  IEEE Journal of Solid-State Circuits, 1975
• Defect analysis and yield degradation of integrated circuits
  IEEE Journal of Solid-State Circuits, 1974
• Applying a composite model to the IC yield problem
  IEEE Journal of Solid-State Circuits, 1974
• Defect density distribution for LSI yield calculations
  IEEE Transactions on Electron Devices, 1973