Atomic mixing in ion probe microanalysis

This publication has 6 references indexed in Scilit:

• Computer simulation of atomic mixing during ion bombardment
  Applied Physics A, 1975
• Investigation of surface layers by SIMS and SIIMS
  Surface Science, 1973
• Surface investigation of solids by the statical method of secondary ion mass spectroscopy (SIMS)
  Surface Science, 1973
• The sputtering of oxides part i: a survey of the experimental results
  Radiation Effects, 1973
• Analysis of thin films by ion microprobe mass spectrometry
  Analytical Chemistry, 1970
• The determination of the thickness, dielectric constant, and other properties of anodic oxide films on tantalum from the interference colours
  Proceedings of the Royal Society of London. Series A. Mathematical and Physical Sciences, 1958