Electron-beam-induced effects on CuInS2 surfaces
- 1 April 1982
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 90 (3) , 345-351
- https://doi.org/10.1016/0040-6090(82)90393-5
Abstract
No abstract availableThis publication has 10 references indexed in Scilit:
- Photoelectrochemistry of the CuInS2/Sn2− systemSolar Energy Materials, 1981
- Oxidation properties of II–VI compound surfaces studied by low-energy electron-loss spectroscopy and 21 eV photoemission spectroscopyJournal of Vacuum Science and Technology, 1980
- An AES-SIMS study of silicon oxidation induced by ion or electron bombardmentApplications of Surface Science, 1980
- On the preparation of CuInS2 thin films by flash evaporationSolar Energy Materials, 1980
- Summary Abstract: Quantitative determination of the surface composition of sulfur-bearing anion mixtures by Auger electron spectroscopyJournal of Vacuum Science and Technology, 1980
- Electron induced dissociation of the NaCl(111) surfaceSurface Science, 1979
- Auger analysis of chlorine in ``HCl- or Cl2-grown'' SiO2 filmsApplied Physics Letters, 1973
- Decomposition of carbon monoxide on a (110) nickel surfaceSurface Science, 1973
- Electron-Stimulated Desorption as a Tool for Studies of Chemisorption: A ReviewJournal of Vacuum Science and Technology, 1971
- Electron-beam assisted adsorption on the Si(111) surfaceSurface Science, 1970