A Method of Measuring Effective Electron Mass in Thin Insulating Films
- 1 January 1967
- journal article
- research article
- Published by Wiley in Physica Status Solidi (b)
- Vol. 24 (1) , 95-98
- https://doi.org/10.1002/pssb.19670240109
Abstract
No abstract availableKeywords
This publication has 8 references indexed in Scilit:
- The Tunneling Time of an ElectronJournal of Applied Physics, 1967
- Tunnel and Sehottky Current in Dielectric Thin Films Considering Film Thickness FluctuationsPhysica Status Solidi (b), 1967
- Electron Transfer Processes through Tantalum—Tantalum-Oxide DiodesJournal of Applied Physics, 1966
- Experimental Determination ofRelationship in Electron TunnelingPhysical Review Letters, 1966
- Thin-Film Titanium Dioxide Capacitors for Microelectronic ApplicationsIEEE Transactions on Component Parts, 1965
- Photoelectric Determination of the Image Force Dielectric Constant For Hot Electrons in Schottky BarriersJournal of Applied Physics, 1964
- Tunnelströme durch Al2O3-Schichten bei Kontakten verschiedener AustrittsarbeitenZeitschrift für Naturforschung A, 1964
- Electron current through metal-insulator-metal sandwichesSolid-State Electronics, 1964