Encapsulated GaAs power MESFET
- 30 December 2002
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
No abstract availableThis publication has 5 references indexed in Scilit:
- High-power-density GaAs MISFETs with a low-temperature-grown epitaxial layer as the insulatorIEEE Electron Device Letters, 1991
- Improved breakdown voltage in GaAs MESFETs utilizing surface layers of GaAs grown at a low temperature by MBEIEEE Electron Device Letters, 1990
- The role of the device surface in the high voltage behaviour of the GaAs MESFETSolid-State Electronics, 1986
- Power-limiting breakdown effects in GaAs MESFET'sIEEE Transactions on Electron Devices, 1981
- Influence of the surface and the episubstrate interface on the drain current drift of GaAs MESFET'sIEEE Transactions on Electron Devices, 1981