A precision, low-force balance and its application to atomic force microscope probe calibration
- 1 April 1994
- journal article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 65 (4) , 903-909
- https://doi.org/10.1063/1.1144919
Abstract
No abstract availableKeywords
This publication has 12 references indexed in Scilit:
- Interalaboratory study on the lithographically produced scanning electron microscope magnification standard prototypeJournal of Research of the National Institute of Standards and Technology, 1993
- A nondestructive method for determining the spring constant of cantilevers for scanning force microscopyReview of Scientific Instruments, 1993
- Force feedback surface force apparatus: Principles of operationReview of Scientific Instruments, 1992
- Long range constant force profiling for measurement of engineering surfacesReview of Scientific Instruments, 1992
- The beam balance as an instrument for very precise weighingMeasurement Science and Technology, 1992
- A vertical force alternating-gradient magnetometerReview of Scientific Instruments, 1990
- The beam balance as a detector in experimental gravitationProceedings of the Royal Society of London. Series A. Mathematical and Physical Sciences, 1987
- Fundamental limits to mass comparison by means of a beam balanceProceedings of the Royal Society of London. Series A. Mathematical and Physical Sciences, 1987
- Young’s modulus measurements of thin films using micromechanicsJournal of Applied Physics, 1979
- The influence of a concentrated mass on the free vibrations of a uniform beamInternational Journal of Mechanical Sciences, 1961