Soft-defect detection (SDD) technique for a high-reliability CMOS SRAM
- 1 January 1990
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Journal of Solid-State Circuits
- Vol. 25 (1) , 61-67
- https://doi.org/10.1109/4.50285
Abstract
No abstract availableKeywords
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