Calibration of an electron back‐scattering pattern set‐up
- 1 May 1993
- journal article
- Published by Wiley in Journal of Microscopy
- Vol. 170 (2) , 125-129
- https://doi.org/10.1111/j.1365-2818.1993.tb03331.x
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Automatic analysis of electron backscatter diffraction patternsMetallurgical Transactions A, 1992
- Accurate microcrystallography using electron back-scattering patternsPhilosophical Magazine, 1977
- Electron back-scattering patterns—A new technique for obtaining crystallographic information in the scanning electron microscopePhilosophical Magazine, 1973
- Computer Generation and Identification of Kikuchi ProjectionsJournal of Applied Physics, 1972