Determination of structure factors of X-rays using half-widths of the Bragg diffraction curves from perfect single crystals
- 1 May 1971
- journal article
- research article
- Published by Wiley in Physica Status Solidi (b)
- Vol. 45 (1) , 333-341
- https://doi.org/10.1002/pssb.2220450138
Abstract
No abstract availableKeywords
This publication has 16 references indexed in Scilit:
- X-Ray Crystal Collimators Using Successive Asymmetric Diffractions and Their Applications to Measurements of Diffraction Curves. III. Type II CollimatorJournal of the Physics Society Japan, 1971
- X-Ray Crystal Collimators Using Successive Asymmetric Diffractions and Their Applications to Measurements of Diffraction Curves. II. Type I CollimatorJournal of the Physics Society Japan, 1971
- X-Ray Crystal Collimators Using Successive Asymmetric Diffractions and Their Applications to Measurements of Diffraction Curves. I. General Considerations on CollimatorsJournal of the Physics Society Japan, 1970
- A new method of determining structure factors of x-rays using half-value widths of diffraction curves from perfect crystalsPhysics Letters A, 1970
- Absolute measurement of structure factors using a new dynamical interference effectActa Crystallographica Section A, 1970
- Accuracies of experimental structure factor valuesActa Crystallographica Section A, 1969
- X-ray scattering factors computed from numerical Hartree–Fock wave functionsActa Crystallographica Section A, 1968
- A method of obtaining an extremely parallel X-ray beam by successive asymmetric diffractions and its applicationsActa Crystallographica Section A, 1968
- Absolute Measurement of Structure Factors of Si Single Crystal by Means of X-Ray Pendellösung FringesJournal of the Physics Society Japan, 1965
- Absolute X-Ray Scattering Factors of Silicon and GermaniumPhysical Review B, 1965