Three-dimensional boundary-value problems in integrated circuits
- 30 June 1967
- journal article
- research article
- Published by Elsevier in Solid-State Electronics
- Vol. 10 (6) , 617-620
- https://doi.org/10.1016/0038-1101(67)90143-8
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Computing values for resistors in semiconductors from diffusion parameters and vice versaMicroelectronics Reliability, 1965
- Resistivity of Bulk Silicon and of Diffused Layers in SiliconBell System Technical Journal, 1962