Computing values for resistors in semiconductors from diffusion parameters and vice versa
- 1 December 1965
- journal article
- Published by Elsevier in Microelectronics Reliability
- Vol. 4 (4) , 359-363
- https://doi.org/10.1016/0026-2714(65)90173-3
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- The average conductivity of diffused layers in semiconductorsSolid-State Electronics, 1964
- Resistivity of Bulk Silicon and of Diffused Layers in SiliconBell System Technical Journal, 1962
- The Diffusion of Phosphorus in SiliconJournal of the Electrochemical Society, 1962
- Four-probe resistivity measurements on rectangular semiconductor filamentsIRE Transactions on Electron Devices, 1956