Semiconductor X-ray spectrometers
- 15 May 1972
- journal article
- Published by Elsevier in Nuclear Instruments and Methods
- Vol. 101 (1) , 113-125
- https://doi.org/10.1016/0029-554x(72)90765-3
Abstract
No abstract availableKeywords
This publication has 14 references indexed in Scilit:
- Germanium surface barrier detectro with deep depletion layer for γ-raysNuclear Instruments and Methods, 1970
- The Impact of Semiconductor Detectors on X-Ray SpectroscopyIEEE Transactions on Nuclear Science, 1970
- Gamma Ray Detectors Made from High Purity GermaniumIEEE Transactions on Nuclear Science, 1970
- X-ray fluorescence analysis. A reviewThe Analyst, 1970
- Decay of:-Subshell Fluorescence Yields and Coster-Kronig Transition Probabilities of TlPhysical Review B, 1969
- The K-fluorescence yield of Te and the total and K-shell conversion coefficients of the 35.48 keV transition in 125I decayNuclear Physics A, 1969
- Application of High-Resolution Semiconductor Detectors in X-ray Emission SpectrographyScience, 1966
- A preamplifier with 0.7 keV resolution for semiconductor radiation detectorsNuclear Instruments and Methods, 1965
- Ion Drift in an n-p JunctionJournal of Applied Physics, 1960
- Ionization Yield of Radiations. II. The Fluctuations of the Number of IonsPhysical Review B, 1947