Microstructure and electrical properties of Sn nanocrystals in thin, thermally grown SiO2 layers formed via low energy ion implantation
- 1 August 1998
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 84 (3) , 1316-1320
- https://doi.org/10.1063/1.368199
Abstract
No abstract availableThis publication has 12 references indexed in Scilit:
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