Extension of the PC version of VEPFIT with input and output routines running under Windows
- 1 January 1995
- journal article
- Published by Elsevier in Applied Surface Science
- Vol. 85, 225-228
- https://doi.org/10.1016/0169-4332(94)00335-1
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
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- Point defects in Si thin films grown by molecular beam epitaxyApplied Physics Letters, 1992
- Positron beam defect profiling of silicon epitaxial layersJournal of Applied Physics, 1991
- Defects and Impurities at the Si/Si(100) Interface Studied with Monoenergetic PositronsPhysical Review Letters, 1988