Determination of the Low Temperature Diffusion of Chromium Through Gold Films by Ion Scattering Spectroscopy and Auger Electron Spectroscopy
- 1 January 1976
- book chapter
- Published by ASTM International
Abstract
No abstract availableKeywords
This publication has 8 references indexed in Scilit:
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- Diffusion studies in Cr-Pt thin films using Auger electron spectroscopyThin Solid Films, 1975
- Analysis of grain boundary diffusion in bimetallic thin film structures using Auger electron spectroscopyJournal of Vacuum Science and Technology, 1975
- Grain boundary self-diffusion in evaporated Au films at low temperaturesThin Solid Films, 1974
- Diffusion measurements in thin films utilizing work function changes: Cr into AuJournal of Applied Physics, 1972
- Backscattering investigation of low-temperature migration of chromium through gold filmsApplied Physics Letters, 1972
- Interdiffusion in thin conductor films — chromium/gold, nickel/gold and chromium silicide/goldMetallurgical Transactions, 1971
- Grain Boundary Diffusion Effects in Films of Gold on ChromiumNature, 1968