The interdependence of geometrical, thermal, and electrical limitations for VLSI logic
- 1 February 1981
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Journal of Solid-State Circuits
- Vol. 16 (1) , 51-53
- https://doi.org/10.1109/jssc.1981.1051536
Abstract
No abstract availableKeywords
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