An isolated-open pattern to de-embed pad parasitics [CMOSFETs]
- 1 January 1998
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Microwave and Guided Wave Letters
- Vol. 8 (2) , 96-98
- https://doi.org/10.1109/75.658653
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
- GHz on-silicon-wafer probing calibration methodsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- An improved de-embedding technique for on-wafer high-frequency characterizationPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- On-chip matching Si-MMIC for mobile communication terminal applicationPublished by Institute of Electrical and Electronics Engineers (IEEE) ,1997
- High Q CMOS-compatible microwave inductors using double-metal interconnection silicon technologyIEEE Microwave and Guided Wave Letters, 1997
- A three-step method for the de-embedding of high-frequency S-parameter measurementsIEEE Transactions on Electron Devices, 1991
- A new method for determining the FET small-signal equivalent circuitIEEE Transactions on Microwave Theory and Techniques, 1988