An improved de-embedding technique for on-wafer high-frequency characterization
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- 9 December 2002
- proceedings article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
No abstract availableThis publication has 3 references indexed in Scilit:
- A three-step method for the de-embedding of high-frequency S-parameter measurementsIEEE Transactions on Electron Devices, 1991
- Achieving greater on-wafer S-parameter accuracy with the LRM calibration techniquePublished by Institute of Electrical and Electronics Engineers (IEEE) ,1989
- A Cost-Effective Production DC/RF On-Wafer GaAs FET Measurement SystemPublished by Institute of Electrical and Electronics Engineers (IEEE) ,1989