A Cost-Effective Production DC/RF On-Wafer GaAs FET Measurement System

Publisher Website

1 November 1989

proceedings article
Published by Institute of Electrical and Electronics Engineers (IEEE)

https://doi.org/10.1109/arftg.1989.323964

Abstract

No abstract available

Keywords

This publication has 2 references indexed in Scilit:

An Accurate FET Modelling from Measured S-Parameters
Published by Institute of Electrical and Electronics Engineers (IEEE) ,2005
Bias dependence of the MODFET intrinsic model elements values at microwave frequencies
IEEE Transactions on Electron Devices, 1989