Scanning microscopic four-point conductivity probes

This publication has 14 references indexed in Scilit:

• Microfour-point probe for studying electronic transport through surface states
  Applied Physics Letters, 2000
• Micro-Four-Point Probes in a UHV Scanning Electron Microscope for In-Situ Surface-Conductivity Measurements
  Surface Review and Letters, 2000
• Scanning nanoscale multiprobes for conductivity measurements
  Review of Scientific Instruments, 2000
• Direct Measurement of the Microscale Conductivity of Conjugated Polymer Monolayers
  Advanced Materials, 2000
• Surface-State Bands on Silicon –Si(111)-√3×√3-Ag Surface Superstructure–
  Japanese Journal of Applied Physics, 2000
• Oxidation of clean silicon surfaces studied by four-point probe surface conductance measurements
  Surface Science, 1997
• Single-Electron Transport in Ropes of Carbon Nanotubes
  Science, 1997
• Atomic Force Microscope
  Physical Review Letters, 1986
• Conductance noise investigations with four arbitrarily shaped and placed electrodes
  Applied Physics A, 1977
• Measurement of Sheet Resistivities with the Four-Point Probe
  Bell System Technical Journal, 1958