Bounds for reliability of consecutive k-within-m-out-of-n:F systems
- 1 March 1993
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Reliability
- Vol. 42 (1) , 156-160
- https://doi.org/10.1109/24.210288
Abstract
No abstract availableThis publication has 7 references indexed in Scilit:
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