Determination of structure factors, lattice strains and accelerating voltage by energy-filtered convergent beam electron diffraction
- 31 May 1994
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 54 (1) , 15-30
- https://doi.org/10.1016/0304-3991(94)90089-2
Abstract
No abstract availableThis publication has 16 references indexed in Scilit:
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