Sensitivity and accuracy of CBED pattern matching
- 30 September 1992
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 45 (2) , 241-251
- https://doi.org/10.1016/0304-3991(92)90512-i
Abstract
No abstract availableKeywords
This publication has 9 references indexed in Scilit:
- Automated structure factor refinement from convergent-beam patternsUltramicroscopy, 1991
- The structures of silicon and germanium: Theory and experiment convergePhysica A: Statistical Mechanics and its Applications, 1990
- Absorptive form factors for high-energy electron diffractionActa Crystallographica Section A Foundations of Crystallography, 1990
- Theory of zone axis electron diffractionJournal of Electron Microscopy Technique, 1989
- Accurate Structure-Factor Phase Determination by Electron Diffraction in Noncentrosymmetric CrystalsPhysical Review Letters, 1989
- Bonding in GaAsPhysical Review Letters, 1988
- Debye–Waller factors of zinc-blende-structure materials – a lattice dynamical comparisonActa Crystallographica Section A Foundations of Crystallography, 1983
- Dynamical Diffraction Theory by Optical Potential MethodsPublished by Elsevier ,1972
- Relativistic Hartree–Fock X-ray and electron scattering factorsActa Crystallographica Section A, 1968