Accurate Structure-Factor Phase Determination by Electron Diffraction in Noncentrosymmetric Crystals
- 30 January 1989
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 62 (5) , 547-550
- https://doi.org/10.1103/physrevlett.62.547
Abstract
A solution to the phase problem is described which gives the phase invariant for electron structure factors with phases and in noncentric crystals. The method exploits the high-voltage dependence of a minimum in convergent-beam transmission-electron-diffraction patterns in the systematics three-beam geometry. For CdS, with and we find . The error in the derived () x-ray structure-factor phase is 0.069°. The method is accurate enough to provide information on the bonding charge distribution in noncentric crystals.
Keywords
This publication has 12 references indexed in Scilit:
- Bonding in GaAsPhysical Review Letters, 1988
- Direct measurement of crystallographic phase by electron diffractionPhysical Review Letters, 1987
- The phases of forbidden reflectionsActa Crystallographica Section A Foundations of Crystallography, 1987
- Solution to the X-ray Phase Problem Using Multiple Diffraction—a ReviewCrystallography Reviews, 1987
- The current status of phase determination by means of multiple Bragg diffractionActa Crystallographica Section A Foundations of Crystallography, 1986
- Influence of Doping on the Crystal Potential of Silicon investigated by the Convergent Beam Electron Diffraction TechniqueZeitschrift für Naturforschung A, 1980
- The application of non-systematic many-beam dynamic effects to structure factor determinationActa Crystallographica Section A, 1971
- Group-Theoretical Treatment of the Energy Bands in Metal Borides MeB6Journal of the Physics Society Japan, 1957
- The scattering of electrons by atomsProceedings of the Royal Society of London. Series A, Containing Papers of a Mathematical and Physical Character, 1930
- Theorie der Beugung von Elektronen an KristallenAnnalen der Physik, 1928