Growth of Pt/Cu(111) characterised by Auger electron spectroscopy, core level photoemission and X-ray photoelectron diffraction
- 1 March 1993
- journal article
- Published by Elsevier in Applied Surface Science
- Vol. 65-66, 63-70
- https://doi.org/10.1016/0169-4332(93)90636-p
Abstract
No abstract availableThis publication has 24 references indexed in Scilit:
- Photoemission study of the Co/Pt(100) interfacePhysical Review B, 1992
- Experimental full-solid-angle substrate photoelectron-diffraction data at 1-keV energies: Implications for photoelectron holographyPhysical Review B, 1991
- Adsorbed layer and thin film growth modes monitored by Auger electron spectroscopySurface Science Reports, 1989
- Electronic and structural properties ofCu0.24Ni0.76(110) and thin films of Cu on Ni(110)Physical Review B, 1989
- Real-space interpretation of x-ray-excited Auger-electron diffraction from Cu(001)Physical Review B, 1988
- Surface core level spectroscopy of transition metals: A new tool for the determination of their surface structureSurface Science Reports, 1985
- Epitaxy of metals on metalsApplications of Surface Science, 1982
- Chemisorption geometry ofoxygen on Cu (001) from angle-resolved core-level x-ray photoemissionPhysical Review B, 1980
- High-Resolution X-Ray Photoemission Spectrum of the Valence Bands of GoldPhysical Review B, 1972
- Many-electron singularity in X-ray photoemission and X-ray line spectra from metalsJournal of Physics C: Solid State Physics, 1970