Pure and mixed titanium, niobium and vanadium oxides as sputtered thick and thin films: Crystallographic properties and phase transitions between 300 and 1800 K I: X-ray diffraction investigations of thick films
- 1 May 1990
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 187 (1) , 25-37
- https://doi.org/10.1016/0040-6090(90)90107-o
Abstract
No abstract availableThis publication has 22 references indexed in Scilit:
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