X-ray and electron channeling characterization of CVD and combustion deposited diamond
- 30 November 1989
- journal article
- Published by Elsevier in Materials Letters
- Vol. 8 (11-12) , 468-471
- https://doi.org/10.1016/0167-577x(89)90033-5
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
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- A Direct Method of Determining Preferred Orientation of a Flat Reflection Sample Using a Geiger Counter X-Ray SpectrometerJournal of Applied Physics, 1949