Deep-Levels Associated with Implanted Titanium in Silicon
- 1 January 1986
- journal article
- Published by Springer Nature in MRS Proceedings
Abstract
No abstract availableKeywords
This publication has 8 references indexed in Scilit:
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- Transition metals in siliconApplied Physics A, 1983
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- Titanium in silicon as a deep level impuritySolid-State Electronics, 1979
- Determination of deep trap levels in silicon using ion-implantation and CV-measurementsApplied Physics A, 1974
- Determination of deep energy levels in Si by MOS techniquesApplied Physics Letters, 1972