Determination of the intrinsic density of silicon below the temperature of intrinsic conduction from electric measurements on transistors
- 1 March 1965
- journal article
- Published by Elsevier in Solid-State Electronics
- Vol. 8 (3) , 189-210
- https://doi.org/10.1016/0038-1101(65)90137-1
Abstract
No abstract availableKeywords
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