Direct access test scheme-design of block and core cells for embedded ASICs
- 4 December 2002
- proceedings article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- p. 488-492
- https://doi.org/10.1109/test.1990.114058
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Electrical design rule checker for core and block based ASIC designsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- Applying testability to an ASIC architectural corePublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- Direct access test scheme-implementation and verification in embedded ASIC designsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- VLSI TestingComputer, 1984