VLSI Testing

This publication has 9 references indexed in Scilit:

• On Random Pattern Test Length
  IEEE Transactions on Computers, 1984
• Iterative Exhaustive Pattern Generation for Logic Testing
  IBM Journal of Research and Development, 1984
• Random-Pattern Coverage Enhancement and Diagnosis for LSSD Logic Self-Test
  IBM Journal of Research and Development, 1983
• Design for testability—A survey
  Proceedings of the IEEE, 1983
• Design for Autonomous Test
  IEEE Transactions on Computers, 1981
• Fault Modeling and Logic Simulation of CMOS and MOS Integrated Circuits
  Bell System Technical Journal, 1978
• Automatic System Level Test a Fault Location for Large Digital Systems
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,1978
• Enhancing Testability of Large-Scale Integrated Circuits via Test Points and Additional Logic
  IEEE Transactions on Computers, 1973
• Test Routines Based on Symbolic Logical Statements
  Journal of the ACM, 1959