Selecting programmable space compactors for BIST using genetic algorithms

This publication has 10 references indexed in Scilit:

• A Cost-effective Test Data Compaction Scheme
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,2005
• Computational Complexity of Test-Point Insertions and Decompositions
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,2005
• PSBIST: A partial-scan based built-in self-test scheme
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,2002
• Programmable space compaction for BIST
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,2002
• PEST-a tool for implementing pseudo-exhaustive self test
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,2002
• Performance of signature analysis: a survey of bounds, exact, and heuristic algorithms
  Integration, 1992
• A data compression technique for built-in self-test
  IEEE Transactions on Computers, 1988
• Stochastic Relaxation, Gibbs Distributions, and the Bayesian Restoration of Images
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,1984
• Optimization by Simulated Annealing
  Science, 1983
• An Advanced Fault Isolation System for Digital Logic
  IEEE Transactions on Computers, 1975