Programmable space compaction for BIST

This publication has 17 references indexed in Scilit:

• Aliasing errors in multiple input signature analysis registers
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,2003
• Computing the error escape probability in count-based compaction schemes
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,2002
• Performance of signature analysis: a survey of bounds, exact, and heuristic algorithms
  Integration, 1992
• An effective BIST scheme for ROM's
  IEEE Transactions on Computers, 1992
• Optimizing error masking in BIST by output data modification
  Journal of Electronic Testing, 1990
• A parity bit signature for exhaustive testing
  IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 1988
• Accumulator Compression Testing
  IEEE Transactions on Computers, 1986
• Built-in Self Testing of Embedded Memories
  IEEE Design & Test of Computers, 1986
• Built-In Self-Test Techniques
  IEEE Design & Test of Computers, 1985
• Testing by Verifying Walsh Coefficients
  IEEE Transactions on Computers, 1983