Accumulator Compression Testing
- 1 April 1986
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Computers
- Vol. C-35 (4) , 317-321
- https://doi.org/10.1109/tc.1986.1676764
Abstract
A new test data reduction technique called accumulator compression testng (ACT) is proposed. ACT is an extension of syndrome testing. It is shown that the enumeration of errors missed by ACT for a unit under test is equivalent to the number of restricted partitions of a number. Asymptotic results are obtained for independent and dependent error modes. Comparison is made between signature analysis (SA) and ACT. Theoretical results indicate that with ACT a better control over fault coverage can be obtained than with SA. Experimental results are supportive of this indication. Built-in self test for processor environments may be feasible with ACT. However, for general VLSI circuits the complexity of ACT may be a problem as an adder is necessary.Keywords
This publication has 11 references indexed in Scilit:
- An Analysis of the Use of Rademacher–Walsh Spectrum in Compact TestingIEEE Transactions on Computers, 1984
- Spectral Fault Signatures for Single Stuck-At Faults in Combinational NetworksIEEE Transactions on Computers, 1984
- Testing by Verifying Walsh CoefficientsIEEE Transactions on Computers, 1983
- The theory of signature testing for VLSIPublished by Association for Computing Machinery (ACM) ,1982
- Design for Testability—A SurveyIEEE Transactions on Computers, 1982
- Syndrome-Testable Design of Combinational CircuitsIEEE Transactions on Computers, 1980
- Measures of the Effectiveness of Fault Signature AnalysisIEEE Transactions on Computers, 1980
- Generation of Optimal Transition Count TestsIEEE Transactions on Computers, 1978
- A Note on Testing Logic Circuits by Transition CountingIEEE Transactions on Computers, 1977
- Transition Count Testing of Combinational Logic CircuitsIEEE Transactions on Computers, 1976