Computing the error escape probability in count-based compaction schemes
- 4 December 2002
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
A unified probabilistic model of count-based compaction is presented that relates the probability of occurrence of the 'counted' events to a circuit's fault detection probabilities. This model enables an identical treatment to be made of all the different count-based techniques proposed to date, e.g., ones, transitions, edges, and spectral coefficients. Based on this model, the authors propose a computation technique for determining the error escape associated with these specific, as well as more general, count-based compaction techniques, under various error models.<>Keywords
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