Characterization of the topography of vacuum-deposited films 2: Ellipsometry
- 15 October 1986
- journal article
- Published by Optica Publishing Group in Applied Optics
- Vol. 25 (20) , 3610-3615
- https://doi.org/10.1364/ao.25.003610
Abstract
Optics InfoBase is the Optical Society's online library for flagship journals, partnered and copublished journals, and recent proceedings from OSA conferences.Keywords
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