Trace element analysis by proton-induced X-ray excitation
- 31 March 1973
- journal article
- Published by Elsevier in The International Journal of Applied Radiation and Isotopes
- Vol. 24 (3) , 153-163
- https://doi.org/10.1016/0020-708x(73)90004-5
Abstract
No abstract availableKeywords
This publication has 8 references indexed in Scilit:
- Sensitivity versus target backings for elemental analysis by alpha excited X-ray emissionNuclear Instruments and Methods, 1972
- An investigation of the analytical capabilities of X-ray emission induced by high energy alpha particlesNuclear Instruments and Methods, 1971
- X-ray analysis: Elemental trace analysis at the 10−12 g levelNuclear Instruments and Methods, 1970
- X-Ray Production Cross SectionsPhysical Review A, 1970
- Instrumental neutron activation analysis of atomospheric pollutants utilizing Ge(Li) .gamma.-ray detectorsAnalytical Chemistry, 1970
- Electron Bremsstrahlung from Proton-Excited TargetsPhysical Review B, 1966
- Excitation of Characteristic X Rays by Protons, Electrons, and Primary X RaysJournal of Applied Physics, 1964
- Gamma-Ray Yields from Coulomb ExcitationPhysical Review B, 1955