Surface morphology and electronic properties of ErSi2
- 1 June 1983
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 104 (1-2) , 175-182
- https://doi.org/10.1016/0040-6090(83)90559-x
Abstract
No abstract availableKeywords
This publication has 7 references indexed in Scilit:
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- Ion-beam-induced modification of silicide formation in rare-earth metals: Er-Si and Tb-Si systemsApplied Physics Letters, 1980
- The formation of silicides from thin films of some rare-earth metalsApplied Physics Letters, 1980