Structural analysis of Si(111) surfaces during homoepitaxial growth
- 20 December 1993
- journal article
- Published by Elsevier in Surface Science
- Vol. 298 (2-3) , 284-292
- https://doi.org/10.1016/0039-6028(93)90040-q
Abstract
No abstract availableKeywords
Funding Information
- Ministry of Education, Culture, Sports, Science and Technology (03243219, 04227216)
- Institute for Materials Research, Tohoku University
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