Comparison of the information content in 〈110〉 - and 〈100〉 -projected high-resolution transmission electron microscope images for the quantitative analysis of AlAs/GaAs interfaces
- 31 January 1994
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 53 (1) , 37-51
- https://doi.org/10.1016/0304-3991(94)90103-1
Abstract
No abstract availableKeywords
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