Quantitative chemical lattice imaging: theory and practice

This publication has 14 references indexed in Scilit:

• Does luminescence show semiconductor interfaces to be atomically smooth?
  Applied Physics Letters, 1990
• Quantifying the Information Content of Lattice Images
  Science, 1989
• Chemical Mapping of Semiconductor Interfaces at Near-Atomic Resolution
  Physical Review Letters, 1989
• Detection of local atomic ordering in high-resolution electron images of quasiamorphous materials
  Applied Physics Letters, 1988
• Detection of oxygen ordering in superconducting cuprates
  Nature, 1987
• Determination of the atomic configuration at semiconductor interfaces
  Applied Physics Letters, 1987
• The effects of elastic relaxation on transmission electron microscopy studies of thinned composition-modulated materials
  Journal of Vacuum Science & Technology B, 1986
• Auto-correlation analysis of high resolution electron micrographs of near-amorphous thin films
  Ultramicroscopy, 1985
• Dark-field electron microscopy of dissociated dislocations and surface steps in silicon using forbidden reflections
  Philosophical Magazine A, 1983
• A Mathematical Theory of Communication
  Bell System Technical Journal, 1948