Detection of local atomic ordering in high-resolution electron images of quasiamorphous materials
- 4 July 1988
- journal article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 53 (1) , 28-30
- https://doi.org/10.1063/1.100112
Abstract
This letter describes an image analysis technique capable of enhancing atomic ordering in high-resolution electron micrographs of quasiamorphous materials. The technique cross correlates the full micrograph with a template selected from the micrograph image field and examines the cross-correlation function (CCF) as a function of template dimension. A critical dimension is found for which the CCF yields evidence of local atomic ordering.Keywords
This publication has 5 references indexed in Scilit:
- Auto-correlation analysis of high resolution electron micrographs of near-amorphous thin filmsUltramicroscopy, 1985
- Computer simulation and interpretation of electron microscopic images of amorphous structuresThe Journal of Physical Chemistry, 1981
- Seeing order in ‘amorphous’ materialsNature, 1976
- Motif detection in quantum noise-limited electron micrographs by cross-correlationUltramicroscopy, 1976
- Conditions for the routine preparation of tantalum/aluminium filmsThin Solid Films, 1975