X-ray and Raman scattering measurements in finite, pseudomorphically strained, Fibonacci lattices

X-ray and Raman scattering measurements have been performed on pseudomorphically strained Si/${\mathrm{Ge}}_{\mathrm{x}}$ ${\mathrm{Si}}_{1\mathrm{-}\mathrm{x}}$ Fibonacci lattices with low stage numbers. Both the x-ray and Raman measurements exhibit significant deviations from large-stage behavior for Fibonacci lattices with fewer than ten stages. A kinematic expression for the diffracted x-ray intensity of a strained-layer Fibonacci lattice is derived in the limit of large stage number.